ETUDE PAR A.T.D. DE L'INFLUENCE DU PLASTIFIANT SUR LES PRODUITS VULCANISESMIHAILA D; SUCIU P.1972; INDUSTR. USOARA; ROMAN; DA. 1972; VOL. 19; NO 7; PP. 413-420; ABS. RUSSE ALLEM. FR. ANGL.; BIBL. 2REF.Serial Issue

CARTES THERMIQUES DES DISPOSITIFS SEMICONDUCTEURS OBTENUES PAR INTERFEROMETRIE HOLOGRAPHIQUESUCIU P; CHISLEAG R; CUCUREZEANU I et al.1977; BUL. INST. POLITEH. "GHEORGHE GHEORGHIU-DEJ" BUCURESTI, ELECTROTEH.; ROMAN.; DA. 1977; VOL. 39; NO 3; PP. 11-16; ABS. ANGL.; BIBL. 6 REF.Article

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A NEW HOLOGRAM INTERFEROMETRY MICROSCOPE FOR INTEGRATED CIRCUITSCUCUREZEANU I; CHISLEAG R; SUCIU P et al.1982; REVUE ROUMAINE DE PHYSIQUE; ISSN 0035-4090; ROM; DA. 1982; VOL. 27; NO 6-7; PP. 677-680; BIBL. 2 REF.Article

LA CONVERSION DU RAYONNEMENT DANS LES COUCHES MINCES DE TELLURURE DE PLOMBOANCEA GHEORGHITA C; CRISTEA P; ZAMFIR E et al.1973; COOPERATION MEDITERR. ENERG. SOLAIRE; FR.; DA. 1973; PP. 28-29; BIBL. 4 REF.Serial Issue

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A temperature- and process-tolerant 64K EEPROMBILL, C. S; SUCIU, P. I; BRINER, M. S et al.IEEE journal of solid-state circuits. 1985, Vol 20, Num 5, pp 979-985, issn 0018-9200Article

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